Paper submission deadline: May 5, 2017
Author notification: June 2, 2017
Final manuscript due: June 16, 2017


Poster submission deadline: May 5, 2017
Author notification: June 2, 2017
Final manuscript due: June 16, 2017
Authors are invited to submit original, unpublished papers describing recent work in the field of
test and design. In addition, authors are invited to submit high quality, practical, industry best
practices. Submissions simultaneously under review or accepted by another conference,
symposium or journal, will be summarily rejected.

About The Conference

responsive screensInternational Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. At ITC, design, test, and yield professionals can confront challenges faced by the industry, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. This ITC conference will be focusing on Test technology development in Asia and India but the submissions may not be limited to topics related to this region. Topics related to DFT and test development across multi geographical regions will be of special interest.
This conference is being held in India under the International Test conference banner to invite researchers, industry teams to present their development work which has a focus on ASIA. This includes design teams which have multiple national presences and are developing designs and products across multiple sites across the world.



Contact Details

Organizing Committee, ITC-India 2017 Bangalore, Karnataka India