10^th IEEE INTERNATIONAL TEST CONFERENCE INDIA 2026

Submission Guidelines

• One or two topic(s) from the topic list, or a description of your topic.
• An abstract of 100 words or less to be entered online.
• An electronic copy of the paper up to 3 pages or an extended summary up to 4 pages, double-columned in IEEE Format (Paper template).
• Your submission must include the problem statement and novelty of solution(s). It should not include information that serves to identify the authors of the manuscript, such as name(s) or affiliation(s) of the author(s). References and bibliographic citations to the author(s) own published works or affiliations should be made in the third person.

Selection Criteria

• Abstracts will be selected based on the novelty of the work and its relevance to the conference. The selected abstracts would be later either categorized into poster presentation or oral presentation, solely based on the merit.
• Upon receiving the acceptance notification, the author will be informed if the paper is classified as a regular full paper or a poster.
• If the submission got accepted under full paper category, it will be considered for inclusion into IEEE Xplore subject to meeting IEEE Xplore’s scope and quality requirements.

Additional Benefits

• Registration fee waiver and partial or full travel support will be provided through fellowship.
• Long term research plan with industry, if research interests align.
• High Impact Research award will be presented in conference banquet.

Topics of Interest

Include (not limited to):

• RF, mm-Wave and THz Testing
• Embedded BIST & DFT
• 3D/2.5D Test
• Emerging Defect Mechanisms
• Adaptive Test in Practice
• Hardware Security and Trust
• ATE/Probe Card Design
• Known-Good-Die testing
• Advances in Boundary Scan
• Memory Test and Repair
• Data Driven Methods
• MEMS Testing
• Data Exchange and Infrastructure
• Mixed-Signal and Analog Test
• Defect-Oriented Testing
• New Technologies and Test
• DFM and Test Diagnosis
• On-Chip Test Compression
• Economics of Test
• Online Test
• End-to-End Data Analysis
• Pre- and Post-Silicon Validation
• Bring Up
• System Test (Applications)
• Power Issues in Test
• System Test (Hardware/Software)
• Protocol-aware Test
• Test-to-Design Feedback
• Reliability and Resilience
• Test Escape Analysis
• Scan Based Test
• SoC/SiP/NoC Test
• Silicon Debug
• IoT Testing
• Simulation and Test
• Jitter, High-Speed I/O and RF Test
• Test Flow Optimizations
• Test Generation and Validation
• Test Resource Partitioning
• Test Standards
• Test Time Analysis and Reduction
• Testing High Speed Optics/Photonics
• Yield Analysis and Optimization