10^th IEEE INTERNATIONAL TEST CONFERENCE INDIA 2026

Submission Guidelines

• A tutorial proposal needs to be submitted in template available on ITC India website
• Submission link: https://easychair.org/my/conference?conf=itcindia2026
• The following details are mandatory:
  • Tutorial title
  • Tutorial abstract
  • Topics and subtopics to be covered, and the approximate time devoted to each topic
  • The targeted audience and prerequisites
  • Preferred tutorial duration: 3 hours (for full tutorials) or 1.5 hours (for short tutorials)
  • Name, affiliation, bio of each author
• Proposals will undergo a panel review process
• All presenters listed in the tutorial proposal must be available for tutorial presentation
• Consent should be obtained from all the presenters and all organizations involved in presenting the material before making the tutorial proposal
• If proposal is accepted, final presentation must be shared by final manuscript due date for review
• Accepted tutorial abstracts will be published in conference proceedings

Call for Submission

Topics of Interest

Include (not limited to):

• 3D/2.5D IC and Chiplet Testing
• Adaptive Test in Practice
• ATE/Probe Card Design
• Automotive Reliability and Testing
• Advances in Boundary Scan
• Silicon Bring Up
• Defect-Oriented Testing
• DFM and Test Diagnosis
• Economics of Test
• Embedded BIST & DFT
• Emerging Defect Mechanisms
• Hardware Security and Trust
• High-Speed Interface Testing
• IoT Testing
• Known-Good-Die testing
• Low-Power Testing Techniques
• Machine learning applications in DFT
• Memory Test and Repair
• MEMS Testing
• Mixed-Signal and Analog Test
• New Technologies and Test
• On-Chip Test Compression
• Online Test
• Pre- and Post- Silicon Validation
• Quantum Computing Hardware Testing
• Reliability and Resilience
• Scan Based Test
• Security and trust in DFT
• SoC/SiP/NoC Test
• Silicon Debug and diagnosis
• Jitter, RF Test
• Simulation and Test
• System Test
• Test-to-Design Feedback
• Test Data Analytics, Big Data in Testing
• Test Escape Analysis
• Test Flow Optimizations
• Test Generation and Validation
• Test Resource Partitioning
• Test Standards and best practices in DFT
• Test Time Analysis and Reduction
• Testing and Validation of AI Hardware
• Testing High Speed Optics/Photonics
• Yield Analysis and Optimization